
7400 NAND Gate IC Pin Diagram Datasheet7400/74LS00
The 7400 NAND Gate IC Pin Diagram Datasheet (7400/74LS00) is a high-quality electronic component, designed for professional applications in} and digital systems.
Gallery
IC Datasheet and Pin Diagram
Additional Technical Information
Boolean Function and Logic Operation
Complete Truth Table
74LS00 Technical Guide: Quad 2-Input NAND Gate - Low-Power Schottky TTL
The 74LS00 is not a mere toy for students; it is a Low-Power Schottky (LS) logic implementation specifically designed to balance power consumption and switching speed. Unlike the standard 74 series, the LS architecture integrates Schottky clamping diodes at the transistor junctions to prevent deep silicon saturation. This reduces storage time to nearly zero, allowing the component to respond at frequencies where the original series would simply suffer thermal asphyxiation.
鈿狅笍 Absolute Maximum Ratings Exceeding these values guarantees an irreversible solid-to-gas state transition. The design must strictly respect the Safe Operating Area (SOA).
| Parameter | Symbol | Max Value | Unit |
|---|---|---|---|
| Supply Voltage | $V_{CC}$ | 7.0 | V |
| Input Voltage | $V_{I}$ | 7.0 | V |
| Output Current (Low Level) | $I_{OL}$ | 16 | mA |
| Junction Temperature | $T_{J}$ | 150 | 掳C |
Pinout and Physical Reference
The DIP-14 package remains the standard for debugging and prototyping. If you are deploying in SMD (SOIC-14), remember that thermal dissipation becomes significantly more critical due to the reduced surface area.
| Pin | Function | Description |
|---|---|---|
| 1, 2 | 1A, 1B | Gate 1 Inputs |
| 3 | 1Y | Gate 1 Output |
| 4, 5 | 2A, 2B | Gate 2 Inputs |
| 6 | 2Y | Gate 2 Output |
| 7 | GND | 0V Reference |
| 14 | $V_{CC}$ | Nominal +5V Supply |
Laboratory Specifications
The dynamic behavior of the device is defined by the Transient Response under specific load conditions.
| Parameter | Condition | Min | Typ | Max | Unit |
|---|---|---|---|---|---|
| $V_{OH}$ (High Level Output) | $V_{CC}$ Min, $I_{OH}$ Max | 2.7 | 3.4 | - | V |
| $V_{OL}$ (Low Level Output) | $V_{CC}$ Min, $I_{OL}$ Max | - | 0.35 | 0.5 | V |
| $t_{PLH}$ (Low-to-High Delay) | $R_L = 2k\Omega, C_L = 15pF$ | - | 9 | 15 | ns |
| $t_{PHL}$ (High-to-Low Delay) | $R_L = 2k\Omega, C_L = 15pF$ | - | 10 | 15 | ns |
Applied Engineering (The "Core")
Internal Topology Analysis
Analysis of Figure 1: The genius of this circuit resides in the multi-emitter input transistor. If you decide to leave inputs floating under the assumption that "nothing will happen," you have effectively manufactured a 60Hz antenna. In TTL logic, an open input is interpreted as a HIGH level due to internal leakage current, but this is a mediocre engineering practice that induces noise and instability into the system.
Universal Logic Implementation
Analysis of Figure 2: This demonstrates the absolute universality of the NAND gate. By bridging the inputs ($A = B$), the boolean equation reduces to: $$Y = \overline{A \cdot A} = \overline{A}$$ This allows for inventory optimization: instead of sourcing four different types of integrated circuits, you can utilize the 74LS00 to resolve the entire combinational logic of a control stage.
Basic Memory Circuit (RS Latch)
Analysis of Figure 3: Utilizing two NAND gates in a cross-coupled feedback configuration creates an RS Latch. This is the crudest yet most effective solution for debouncing mechanical switches. Without this circuit, the metallic contact bounces of a physical button would cause your microcontroller to register fifty pulses instead of one, exposing a fundamentally deficient hardware design.
Transient Behavior and Delay
Analysis of Figure 4: Propagation delay ($t_{pd}$) is non-negotiable. If you are designing high-frequency synchronous circuits, ignoring the 15ns of delay accumulated by each NAND stage will lead you directly to a Race Condition. Real-world engineering is done by calculating the worst-case scenario, not by praying that the silicon is "magically fast."
BySMax Verdict
The 74LS00 in our inventory has undergone Transient Response stress tests that exceed generic market clones. We have selected it because it maintains an extremely low $V_{OL}$ even when operating near the $I_{OL}$ limit, ensuring that the noise margin does not degrade in hostile industrial environments.
Logic Gate IC Projects 7400 NAND Gate IC Pin Diagram Datasheet
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